Benchmarking UHV STM and AFM Technology

Standing waves on Au(111) at 200 K
Author:R. Möller et al.
Publication:‘Thermovoltages in STM‘, R. Möller; Scanning Probe Microscopy - Analytical Methods, Ed. R. Wiesendanger Springer Verlag, 49 (1998) & ‘Thermovoltage in scanning tunnelling microscopy‘, D. Hoffmann, J. Seifritz, B. Weyers, R. Möller, Journal of Electron Spe
Instrument: VT SPM
NC-AFM QPlus measurements on Si(111) at 1053 K
Institute:Measurement: Omicron
Instrument: VT SPM
Observation of the transition between the 7x7 and the highly mobile (quasi-liquid) 1x1 phase on Si(111) at 1050 K
Institute:Measurement: Omicron
Instrument: UHV STM 1
STM images of P-passivate Si(100) recorded at 800 K
Author:Deng-Sung Lin et. al.
Publication:Physical Review B Volume 61, Number 4 (2000)
Instrument: UHV STM 1
Co-Si magic clusters
Author:E.S. Tok
Publication:Chem. Phys., 9, 991-995, (2007)
Instrument: VT SPM
Hydrogen diffusion at 568 K on a Si (001) surface
Author:M.Lawrenz et. al.
Publication:PHYSICAL REVIEW B 75, 125424 (2007)
Instrument: VT SPM
Intrinsic diffusion of hydrogen on rutile TiO2(110) at 357 K
Author:S.-C. Li, Z. Zhang, D. Sheppard, B. D. Kay, J. M. White, Y. Du, I. Lyubinetsky, G. Henkelman, & Z. Dohnalek
Publication:J. Am. Chem. Soc. (in press, 2008)
Instrument: VT SPM
Growth of multilayer ice films (Temperature 140 K)
Author:K. Thürmer and N. C. Bartelt
Publication:PHYSICAL REVIEW B 77, 195425 (2008), Physical Review Letters 100,186101 (2008))
Instrument: VT SPM
Mapping spin injection on the atomic scale at 100 K
Author: V. P. LaBella et al.
Publication:SCIENCE 25, Vol 292 (2001)
Instrument: VT SPM
Desorption of H2 on Si(100) 2x1 from 590 K to 611 K
Author:Deng-Sung Lin and Ru-Ping Chen
Publication:Physical Review B Volume 60, Number 12, (1999)
In-situ high-temperature STM studies of surface dynamics on atomically smooth TiN(001)
Author:I. Petrov et al.
Institute:Materials Science Department & the Frederick Seitz Material Research Laboratory, Univ. of Illinois, USA
Chiral aromatic heptahelicene C30H18([7]H) on Cu(111) substrate at 50 K
Author:R. Fasel, M. Parschau, K.-H. Ernst
Publication:Angew. Chem. Int. Ed. 42 , 5178 (2003); Angew. Chem. 115, 5336 (2003); Nature 426, 615 (2003)
Instrument: VT SPM
Conductivity of different terminations in YBa2Cu3O6.6. at 25 K (Scan range 500 nm × 350 nm)
Author:G. Urbanik et al.
Publication:Eur. Phys. J. B 69, 483–489 (2009)
Probing the Electronic Properties of Self-Organized Poly (3-dodecylthiophene) Monolayers by Two-Dimensional Scanning Tunnelling Spectroscopy Imaging at the Single Chain Scale
Author:L. Scifo et al.
Publication:Nano Lett. 6, 1711–1718 (2006)