Large Sample SPM

STM (Large Sample STM)

The Large Sample STM utilises a scanned tip design with a single tube scanner which has a scan range  (xyz) of 12 μm × 12 μm × 1.5 μm. The tips are exchangeable in-situ. The first I/V conversion stage is located in-situ, close to the scanner in order to achieve the best signal-to-noise ratio and optimal performance. The scanner is mounted on an independent, orthogonal, and guided 3D coarse positioning device with 10 mm × 10 mm × 10 mm travel in xyz direction comment. An upgrade to QPlus® AFM is available.

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STM & AFM (Large Sample AFM)

The Large Sample AFM is an atomic force microscope with beam deflection detection and a scanned tip design. The single tube scanner has a scan range (xyz) of 10 μm × 10 μm × 1.5 μm.

It uses remote controlled mirror motors for beam adjustment and a position sensitive photo diode detector. Operation modes include contact mode with normal force/lateral force detection and non-contact modes (i.e. NC-AFM, SKPM, EFM, MFM). The Large Sample AFM also includes STM detection with the first I/V conversion stage in-situ, located close to the scanner in order to achieve best signal-to-noise ratio and optimal performance.

The scanner is mounted on an independent, orthogonal, and guided 3D coarse positioning device with 10 mm × 10 mm × 10 mm travel in xyz direction. An upgrade for QPlus® AFM is available.

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QPlus AFM (optional)

The QPlus® sensor is based on a quartz tuning fork and a new approach for non-contact atomic force microscopy. Due to the stiffness of the QPlus® sensor (spring constant ~ 1800 N/m), it can be operated with smaller oscillation amplitudes compared to conventional cantilevers.

The sensor is also useful for AFM navigation of an STM tip and subsequent STM imaging and spectroscopy. Due to the stiffness and the use of solid metal tips, stable STM operation can be achieved using the QPlus® sensor. The QPlus® sensor is therefore ideal for the inclusion in STM‘s, and also as a complementary sensor for beam deflection instruments.

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