Brochures

Spring 2018 News
PDF  1.84 MB
SO_Product Guide 2017
PDF  2.28 MB
TESLA JT SPM
PDF  2.55 MB
Fermi DryCool SPM
PDF  2.19 MB
LT STM III
PDF  4.77 MB
LT NANOPROBE Brochure
PDF  2.78 MB
SO_MATRIX 4
PDF  907.50 KB
MATRIX and Zyvector
PDF  3.04 MB
HAXPES Lab
PDF  1.75 MB
ARPES-Lab
PDF  3.56 MB
HiPP-Lab
PDF  6.24 MB
2D / 3D VLEED detector Infosheet
PDF  1.05 MB
ARTOF-2 Electron Spectrometer Infosheet
PDF  1.93 MB
Cryo Manipulators Infosheet
PDF  1.17 MB
DA30-L Electron Spectrometer Infosheet
PDF  629.56 KB
EW4000 Electron Spectrometer Infosheet
PDF  1.14 MB
HiPP-2 Electron Spectrometer Infosheet
PDF  950.14 KB
HiPP3 Electron Spectrometer Infosheet
PDF  2.39 MB
R3000 Electron Spectrometer Infosheet
PDF  667.20 KB
R3000 HP Electron Spectrometer Infosheet
PDF  1.04 MB
Retractable VUV5K Infosheet
PDF  1.13 MB
Lab10 MBE System
PDF  2.49 MB
FALL 2017 News
PDF  2.31 MB
Spring 2017 News
PDF  2.08 MB
SO_MATRIX 4 Beam Deflection Infosheet
PDF  1.32 MB
FALL 2016 News
PDF  2.31 MB
SPRING 2016 News
PDF  2.66 MB
SO_Scanned Probe Lithography
PDF  2.47 MB
SO_Fermi SPM

SPM in a Temperature Range from 15 K to 400 K

  • Compact Design• Compact Design
  • Tip and Sample Cooled
  • Low Thermal Drift
  • STM, AFM & Spectroscopy
  • Sub pA STM
  • Sensor Exchange & 2D Coarse
PDF  3.19 MB
SO_Variable Temperature UHV SPM

Benchmarking UHV STM and AFM Technology

  • 25K – 1500 K
  • True pA STM
  • Improved dI/dV Spectroscopy
  • Beam Deflection AFM
  • QPlus AFM
  • In-situ Evaporation
PDF  4.22 MB
SO_VT XA Series

Benchmarking UHV STM and AFM Technology

  • 50 K – 500 K / 650 K
  • True pA STM
  • Improved dI/dV Spectroscopy
  • Beam Deflection AFM
  • QPlus AFM
  • In-situ Evaporation
PDF  3.73 MB
SO_MBE Solutions
  • Growth System Soluti ons for all
  • Fields of Applicati on
  • Excellent Sample Thickness &
  • Doping Homogenity
  • Layer Growth with Outstanding
  • Performance
  • Low Background Doping Level
  • Excellent Carrier Density & Mobility
  • Very Low Defect Density
PDF  4.42 MB
SO_FOCUS PEEM

Photo Emission Electron Microscope

  • 20 nm Lateral Resolution
  • Easy to Operate
  • Real-Time Imaging
  • Surface Sensitivity Microscopy
  • Chemical Mapping
  • Local Spectroscopy
  • Compatible with MULTIPROBE UHV Systems
PDF  10.98 MB
I-PDF Matrix vs Scala
PDF  1.83 MB
Zyvector Booklet
PDF  3.47 MB
IC_VT-SPM
PDF  550.88 KB
IC_Mistral
PDF  1.26 MB
IC_ESCA 2SR
PDF  530.37 KB
IC_NanoESCA II
PDF  1.12 MB
IC_Argus CU
PDF  1.64 MB
IC_HIPP-2
PDF  705.23 KB
IC_MBE Systems
PDF  1.49 MB
Interactive PDF-NanoESCA II
PDF  938.63 KB
Argus CU

Next Generation Hemispherical Analyser

  • Excellent Sensitivity
  • Compresion Lens
  • True Counting Multi-Anode Detector
  • Linear Response up to the Highest Count Rates
  • Excellent Dynamic Range
  • Snapshot and Dynamic XPS
  • Chemical State Mapping
PDF  2.18 MB
MATRIX for Electron Spectroscopy

Version V 3.1

  • Intuitive user interface
  • Predefined experiment setup
  • Excellent data management
PDF  2.51 MB
MULTIPROBE

A Family of Multi-Technique Surface

  • Science Systems - Single Supplier, Total Support for Multiple Techniques
  • Flexible, Turn-Key UHV Systems
  • Designed According to Customer’s Requirements
PDF  4.61 MB
NanoSAM Lab

Scanning Auger with Ultimate Resolution

  • 5 nm SAM Resolution
  • 3 nm SEM Resolution
  • Depth Profi ling and Charge Neutralisation
  • Additional Techniques: EBSD, SEMPA, FIB, EBL



PDF  989.34 KB
Feedback