Compact XPS/UPS/ARPES Analyser with Patented Deflection

The DA20 is a compact analyser for high energy resolution measurements required in XPS and ARPES applications. In addition, the analyser is capable of measuring a full cone of ±10 degrees opening angle without sample movement making it ideally suited for ARPES.

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HREELS: Measuring Phonon Dispersion

MCES150 is a highly collimated and monochromatic electron source with an extremely narrow energy distribution. The combination of this source with Scienta Omicron high resolution ARPES analysers creates a platform for vibrational spectroscopy and phonon dispersion measurements. Using the 2D detector system of the analyser enables massive parallelisation and reduces the measurement time by orders of magnitude compared to the traditional approach.

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BAR XPS: For Studies of Industrially Relevant Catalytic Reactions

It is estimated that up to 90% of chemical products are produced via catalysis. Many heterogeneous catalytic reactions occur at high pressures and temperatures. To study these types of catalytic reactions, researchers at Stockholm University have constructed an instrument capable of measuring XPS under conditions of > 1 bar of pressure in the vicinity of the catalytically reactive surface.

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Cryo Manipulators: A complete range for ARPES

A complete range of cryo manipulators is available for the ARPES Lab. These state-of-the-art cryo manipulators come in 4-, 5- and 6-axes and both open and closed cycle versions, with lowest possible sample temperatures, proven ARPES performance and attractive pricing.

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ARPES-Lab: The Expert Solution for Angle Resolved Photoemission Spectroscopy

Angular resolved photoemission spectroscopy (ARPES) has emerged as the most powerful technique to understand the electronic structure of materials and what can influence their physics and chemistry.

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UHV Suitcase: Safe, Convenient and Versatile Sample Transfer

The ever-increasing complexity of sample preparation and analysis requires collaborations between research groups, including sharing equipment such as synchrotrons or nano-structuring tools or even using a specialist‘s MBE capabilities. Sometimes sample exchange between incompatible systems within the same building also requires a UHV transport container, for example, to avoid connection of vibration-sensitive analysis equipment to production MBE systems with cryo-pumps.

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NanoESCA: Next-Generation Photoemission Tool

The Scienta Omicron NanoESCA is a cutting edge instrument with a “Live View” energy-filtered real- & momentum space imaging, offering precise sample spot definition for small area ARPES. The other key features include 1) one-shot 180 degree ARPES overview without sample movement; 2) LHe cooled microscope sample stage and dedicated light-sources; and 3) Excellent 2D imaging energy-resolution.

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XPS-Lab: Versatile Electron Spectroscopy Platform

The XPS-Lab has been designed to combine outstanding quantitative XPS performance and ease of operation with a modular sample handling concept. The exceptional value of the XPS-Lab is based on the high-transmission and high-speed Argus CU hemispherical analyzer.

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Scienta Omicron Product Guide 2017

The Scienta Omicro Product Guide includes information on how combined Scanning Probe Microscopy (SPM), Electron Spectroscopy and Thin-Film technology serving the scientific challenges. More specifically, it includes in-depth information on SPM related instruments; electron spectrometers and systems as well as electron analyzers and a wide range of standard sources; modular MBE Systems; and customer specific solutions.

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QSpeed: Simplifying QPlus AFM

The new QSpeedTM AFM mode paves the way for stable and high speed QPlus® imaging with large scan ranges and high corrugations. QSpeed is based on the Tuned Oscillator AFM technique which has recently been advanced by Udo Schwarz´s group at Yale University through which fit is licensed.

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TERS - our new concept for advanced optical experiments at helium temperature in ultra-high vacuum environment.

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TESLA JT SPM: LT & Variable Magnetic Fields

TESLA JT is a modern 1 Kelvin scanning probe microscope setting the standard in SPM performance in varying magnetic fields with picometer stability and thermal drift below 20 pm per hour. Besides its ergonomic design and high performance SPM operation it´s low Helium consumption and long LHe holding times make it an ideal tool for successful forefront scientific work.

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Fermi DryCool SPM

The Fermi DryCoolTM SPM combines a cryogen-Free cooling system with a state-of-the art SPM head for high resolution STM and QPlus® imaging and spectroscopy in UHV for extended operations at low (<10K) and variable temperatures.

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LT STM III: Ultimate SPM Performance Below 5K

Since its introduction in 1996, Scienta Omicron´s Low Temperature STM has set the standard for stability, performance and productivity for 4LHe bath cryostat STMs. It is a high quality allrounder SPM delivering broad scientific output and regularly groundbreaking results employing usually more than one technique. It´s base is an ultra-stable platform offering a large range of operation modes including STM, QPlus AFM, STS, IETS, force spectroscopy, optical experiments and atom manipulation. Scienta Omicron´s LT STM Qplus AFM imaging of “on-surface chemistry”, atom manipulation, carbon, superconductors, semiconductors, gases on metals, and magnetics are only a few examples where research takes great advantage of low temperature SPM.

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LT NANOPROBE: Atomically Precise Electrical Probing

The Low Temperature Nanoprobe defines a new class of analytical instrumentation that merges SEM-navigated local transport measurements with atomic scale precision, high performance STM imaging, spectroscopy, and manipulation at LHe temperatures. The key features include 1) transport measurements with atomic scale precision; 2) for independent atomic resolution SPMs for probe approach and imaging; 3) extreme low thermal drift at T<5K; 3) simultaneous SEM imaging at low temperature for rapid tip navigation; 4) STM spectroscopy and atom manipulation; and 5) QPlus® nc-AFM.

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MATRIX 4: The SPM Controller Evolution

The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The key features include 1) intuitive and flexible experiment control; 2) best-in-class noise floor; 3) ultimate QPlus capability; 4) full 64-bit software; and 5) modular upgrade paths.

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Zyvex CHC Controller

Scienta Omicron and Zyvex Labs announce a new leap forward in STM design; real- time position correction. The ZyVector STM control system from Zyvex Labs uses live position correction to enable atomic-precision STM lithography. Now the same live position correction technology is brought to the Matrix STM control system for microscopy and spectroscopy users, enabling fast settling times after large movements in x, y and z, and precise motion across the surface, landing and remaining at the desired location.

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HAXPES Lab: A Window to the Bulk

Scienta Omicron‘s HAXPES Lab brings hard X-ray photoelectron spectroscopy (HAXPES) capability directly to the local laboratory environment. This novel system probes bulk sample properties and accesses deep core level electrons via photoelectron spectroscopy (XPS) without the need for a synchrotron end station. Using world class technology and expert engineering, the HAXPES Lab sets the standard for laboratory based high energy photoelectron spectroscopy.

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ARPES-Lab: Comprehensive ARPES Solution
Angular resolved photoemission spectroscopy (ARPES) has emerged as the most powerful technique to understand the electronic structure of materials and what can influence their physics and chemistry. The Scienta Omicron ARPES Lab performs band structure mapping measurements faster, more precisely, yielding data sets with fewer variables for simplified data analysis than any other system available.
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HiPP Lab: Advanced APPES Measurements Made Simple

With HiPP-Lab Scienta Omicron provides a novel solution for laboratory based ambient pressure photoelectron spectroscopy (APPES). Drawing on extensive experience in the fields of photoelectron spectroscopy (PES), UHV technology, and system design, Scienta Omicron has designed the HiPP-Lab as an easy to use system that encourages user creativity through flexibility, modularity and an innovate chamber design. Scienta Omicron has vast experience in system manufacturing in a broad range of surface science and material science applications with more than 500 PES analyzers and approximately 1000 systems deployed worldwide. This broad knowledge base has been critical for the development of the HiPP-Lab.

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2D/3D Ferrum VLEED Detector for DA30-L

This 2D or 3D spin detection utilizes the exchange scattering mechanisms to be 50x more efficient than Mott schemes. One or two Ferrum VLEED detectors mount on a proprietary transfer lens with high speed switching between channels. The DA30-L's unique deflection mode directs any part the full acceptance cone to the spin detectors without sample rotation. Integrating the Ferrum and the DA30-L creates the highest quality and most efficient spin ARPES measurements.

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ARTOF-2 Electron Spectrometer: For ARPES

The Scienta Omicron ARTOF 10k analyser marked a revolution in the field of angle-resolved photoelectron spectroscopy (ARPES). Using time of flight (TOF) for energy dispersion and a precisely controlled electron lens system eliminate the need for an entrance slit as used in hemispherical analysers. This results in unrivalled high transmission, parallel full cone detection, and excellent energy resolution for typical ARPES energy ranges. The Scienta Omicron ARTOF-2 further improves the ARTOF concept on energy window width, resolution, and especially for kinetic energies above 10 eV. The high transmission of ARTOF-2 make it ideal for time resolved and coincidence experiments as well as radiation sensitive samples.

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ARPES Closed Cycle Manipulators

A complete range of cryo manipulators for ARPES is offered by Scienta Omicron in collaboration with Fermion Instruments and Omnivac. This strategic partnership provides cryo manipulator options for 4-, 5- and 6-axes available in both open and closed cycle versions, with lowest possible sample temperatures, proven ARPES performance and attractive pricing.

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DA30-L: Angle Resolved Electron Spectrometer

Since the launch in 2013, the DA30 family of analysers have revolutionized the field of ARPES. Using a fast electrostatic deflector concept, this well proven analyser can measure electrons in a full cone of 30 degrees opening angle. This opens up for band mapping of the full surface Brillouin zone without the need to rotate the sample and preserves incident and exit angles. The deflection capability ensures fixed spot shape and position on the sample and eliminates mechanical backlash, information depth variations, and angle dependent matrix element effects.

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EW4000: Electron Spectrometer

The Scienta Omicron EW4000 is breaking new grounds for advanced photoelectron spectroscopy experiments at high energies, hence opening new directions of science. The EW4000 goes one step further. Expanding the parallel angular detection range to 60 degree gives great possibilities for high transmission HAXPES measurements as well as novel Standing Wave and XPD experiments.

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HiPP-2: High Energy Ambient Pressure Electron Analyser

The Scienta Omicron HiPP-2 analyser is developed for ambient pressure photoelectron spectroscopy (HiPP or APPES) as well as hard x-ray photoelectron spectroscopy (HAXPES). This state-of–the-art analysis tool enables angle-resolved photoemission at ambient pressures up to 50 mbar and electron kinetic energies up to 10 keV, as well as the combination of the two.

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HiPP-3: Imaging Ambient Pressure Electron Analyser

The HiPP-3 analyser features advanced technology for outstanding imaging XPS at ambient conditions with a spatial resolution better than 10 μm. In addition, the unique Swift Acceleration Mode enables unparalleled transmission, with countrates improved by up to a factor of 10.

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R3000: Electron Spectrometer

Scienta Omicron analysers have always opened new possibilities in electron spectroscopy. The Scienta Omicron R3000, designed to combine minimum size and maximum performance, is no exception. The R3000 can be operated in Fix Mode, where a spectrum can be recorded quickly within seconds by taking a snap shot of the detector image. The R3000 is optimised for transmission of high intenisty UPS and XPS as well as an angular lens mode for ARPES.

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Retractable VUV5k-Package

The retractable VUV5k-package is the combination of the VUV5000 UV-source and the VUV5047 UV-monochromator. These components form a unique light source. The package allows a working pressure in the 10-11 mbar range during lamp operation.

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EVO-50 MBE System: Next Generation of Customizable MBE Solution

The EVO-50 MBE System is designed to fulfil the highest and most stringent requirements of modern thin-film deposition. It is suitable and optimized for the growth of ultra-high purity semiconductors and related material systems.

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Lab10 MBE: MBE Solution for Surface Science

The Lab10 MBE is a turnkey small sample research tool for innovative material development under UHV conditions. This system is designed to fulfil the highest and most stringent requirements of modern thin-film deposition. Furthermore, the small sample concept is intended to interface the MBE system with an UHV analysis module to offer the best platform for fundamental research of novel materials.

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MATRIX 4: Beam Deflection AFM Option

The Scienta Omicron MATRIX 4 Beam Deflection and Plus AFM Control System with digital PLL is an integral solution for the MATRIX control system and a perfect match with the Scienta Omicron SPM’s. Includes sensor alignment & control, light source control, resonance/phase curve acquisition, amplitude channel, automatic phase adjustment and more. Processor board with an integrated Kelvin regulator.

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ZyVector: STM Control System for Lithography

Scienta Omicron and Zyvex Labs announce a collaboration to develop and distribute tools for research and manufacturing that require atomic precision. The ZyVector STM Control System from Zyvex Labs turns a Scienta Omicron STM into an atomically-precise scanned probe lithography tool, and will be distributed world-wide by Scienta Omicron.

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Fermi SPM

The Fermi SPM is a compact and cost effective solution for UHV SPM in a temperature range from 15 K to 400 K. The other key features include 1) tip exchange and 2D coarse; 2) sample and tip in thermal equilibrium; 3) low thermal drift; 4) STM, AFM and Spectroscopy; and 5) sub pA STM.

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VT XA Series: Variable Temperature UHV SPM

The VT XA design forms a new series of VT instruments using standard Scienta Omicron samples plates. The philosophy of the XA series is to provide maximum compatibility with many different surface science techniques, like MBE, RHEED and different kinds of electron spectroscopy.

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MBE Solutions: Modular MBE Systems

The MBE Solution is comprised of Lab10 MBE, EVO-25/-50 and PRO-75/100 enabling MBE and analysis in a single system. The key features include 1) excellent sample thickness and doping homogeneity; 2) layer growth with outstanding performance; 3) low background doping level; 4) excellent carrier density and mobility; and 5) very low defect density.

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FOCUS PEEM: Photo Emission Electron Microscope

Photo Emission Electron Microscope

  • 20 nm Lateral Resolution
  • Easy to Operate
  • Real-Time Imaging
  • Surface Sensitivity Microscopy
  • Chemical Mapping
  • Local Spectroscopy
  • Compatible with MULTIPROBE UHV Systems
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The advantages of the MATRIX Control System over its predecessor SCALA are: easier to use due to a self-explanatory graphical user interface (GUI); improved signal to noise level; a digital scan generator with no electronic drift; a digital regulator with more functionalities and flexibility; more measurement channels; improved AFM control with a new digital PLL controller; automated drift correction by image correlation technique; extended scripting and remote access functions; and flexible for PC model changes.

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Zyvector Booklet

Zyvex Labs pursues research and develops tools for creating quantum computers and other transformational systems that require atomic precision, towards its eventual goal of Atomically Precise Manufacturing. As part of this effort, ZyVector turns the world-class Scienta Omicron VT-STM into an STM lithography tool, creating the only complete commercial solution for atomic precision lithography.

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NanoESCA II: The Ultimate PEEM Instrument

NanoESCA II is the technical refinement of the NanoESCA I. Simply said, it is the ultimate PEEM instrument. NanoESCA II combines high special resolution and excellent spectroscopy performance in a single instrument allowing for forefront photoemission research on micro and nano scales. One application for high resolution micro area spectroscopy is μARPES on localized 2D materials with outstanding momentum resolution using laboratory excitation sources.

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NanoSAM Lab: Scanning Auger with Ultimate Resolution

The NanoSAM Lab is the ultimate tool for the analysis of small structures. Driven by the unique performance of the UHV Gemini electron column, it guarantees unrivalled resolution below 5 nm in Scanning Auger Microscopy (SAM) and better than 3 nm in SEM. It provides possibility of depth profiling and charge neutralization. Some additional techniques include: EBSD, DEMPA, FIB, and EBL.

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MULTIPROBE: Multi-Technique UHV Surface Science Systems

The modular and compact design of the MULTIPROBE systems has proven itself more than 1000-times and forms the core module for multi-technique Ultra-High-Vacuum (UHV) applications. A typical comprehensive MULTIPROBE system combines UHV SPM (at variable or dedicated low temperatures) and electron spectroscopy techniques (Mono-XPS, UPS, AES/SAM…) with thin film growth facilities (MBE, PLD, Sputtering, etc.). Our strength is to combine a wide range of techniques in a single UHV system - with uncompromised performance.

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Argus CU: High Transmission XPS Analyser

Argus is a high-transmission, high-speed hemispherical analyser with multi-channel detection technology developed and optimized for uncompromised photoelectron spectroscopy. Argus represents a unique approach to multichannel XPS detection, matching today´s demanding requirements for fast and trusted quantitative XPS, ease-of-use and reliability.

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